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Fracture and Fatigue of MicroEletroMechanical Systems
Primary Researchers: Robert
L. Mullen
Roberto
Ballarini
National
Science Foundation award information
Abstract:
The behavior of polycrystalline films was analyzed using a Poisson-Vorinoi tessellation to construct polycrystalline domains. Finite elements were then used to calculate the elastic properties of the ensemble when each grain had a uniformly distributed random orientation. From Monte-Carlo calculations, mean, variances and higher order moments were calculated as a function of anisotropic crystal properties and number of grains in a domain. This work was then extended to calculation of local stress intensity factors in a polycrystalline domain. The coefficient of variations for highly anisotropic materials was found to be 40%. A micro fracture device with on-chip loading was designed and fabricated. The device can statically load to failure a beam with a 2.0 micrometer notch. Dynamic fatigue loading can also be applied. The successful device consists of an electrostatic loading frame 1.5 millimeters in length that can produce forces in the hundreds of micro-Newton range. The fracture specimen is a modified notched cantilever beam, designed to provide mechanical amplification of the loading. Fracture properties of polysilicon films were measured
using both on-chip and external loading methods.
Acknowledgment: The authors
acknowledge support from the National Science Foundation's Grant CMS 9416752
CWRU Department of Civil Engineering Communication
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